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Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee On Vlsi; IEEE International Workshop On Memory Technology, Design, And Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee Listings

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1 Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California

Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee
0818641509 / 9780818641503
Piscataway, New Jersey, U.S.A., IEEE, 1993, Soft cover, Very Good
Book, 

Very good condition. No interior writing or highlighting. Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California By Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee Product Details Paperback: 160 pages Publisher: Ieee (August 1993) Language: English ISBN-10: 0818641509 ISBN-13: 978-0818641503 Product Dimensions: 11 x 8.5 x 0.5 inches

Price: 39.99 USD
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2 Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California

Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee
0818671025 / 9780818671029
Los Alamitos, California, U.S.A., IEEE Computer Society, 1995, Soft cover, Very Good
Book, 

Very good condition. No interior writing or highlighting. Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California By Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee Product Details Paperback: 129 pages Publisher: Institute of Electrical & Electronics Enginee (August 1995) Language: English ISBN-10: 0818671025 ISBN-13: 978-0818671029 Product Dimensions: 11 x 8.5 x 0.5 inches

Price: 44.99 USD
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