Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California


Very good condition. No interior writing or highlighting. Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California By Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee Product Details Paperback: 160 pages Publisher: Ieee (August 1993) Language: English ISBN-10: 0818641509 ISBN-13: 978-0818641503 Product Dimensions: 11 x 8.5 x 0.5 inches

Title: Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California

Author Name: Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee

Categories: Other,

Publisher: Piscataway, New Jersey, U.S.A., IEEE: 1993

ISBN Number: 0818641509

ISBN Number 13: 9780818641503

Binding: Soft cover

Book Condition: Very Good

Type: Book

Seller ID: 009552

Keywords: Records of the 1993 IEEE International Workshop on Memory Testing August 9-10, 1993 San Jose, California COMPUTER STORAGE DEVICES COMPUTERS INPUT College Textbooks Computer Textbook IT Technology